Investigation of dislocation structure evolution using dark-field X-ray microscopy

3rd. Apr. 2024, ICAMS Special Seminar, Ruhr-Universität Bochum, IC 02-718

Start: 3rd. Apr. 2024. 10:00 a.m.
End: 3rd. Apr. 2024. 11:00 a.m.

Felix Frankus Department of Civil and Mechanical Engineering, Technical University of Denmark, Kgs. Lyngby


A physically informed understanding of plasticity is essential for accurate models. Discrete dislocation dynamics (DDD) offer a framework for studying plastic deformation on the microscopic length-scale. Validating these models with experimental data is however challenging, as dislocation structures in bulk specimens and their evolution under load are not directly accessible through standard imaging techniques. Recent developments on synchrotron-based dark-field X-ray microscopy (DFXM) have enabled the measurement of such structures in in-situ strained tensile specimens.

This talk will present recent results of dislocation interaction in in-situ strained aluminium tensile specimens. A workflow for extraction and identification of the observed dislocation structures and their interface to discrete dislocation dynamics simulations will be shown.

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