In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples
Kirchlechner, C. and Keckes, J. and Micha, J.S. and Dehm, G.
NEUTRONS AND SYNCHROTRON RADIATION IN ENGINEERING MATERIALS SCIENCE: FROM FUNDAMENTALS TO APPLICATIONS: SECOND EDITION
Volume: Pages: 425-438
Uchic and co-workers were the first ones who performed uniaxial compression tests on micron-sized samples and inspired scientists worldwide to perform similar microcompression, tension, or bending experiments. The straining device is able to perform compression, tensile, or bending experiments. Complementary fine energy scans can be performed by inserting a tunable monochro-mator or a multi-colored rainbow filter in the white beam path in order to determine the energy of selected reflections and to further analyze the full strain tensor. For Laue diffraction experiments, a white X-ray beam consisting of a broad energy band pass is used. Nevertheless, scanning electron microscopy (SEM) just probes the sample surface and, therefore, is only able to monitor glide steps formed by dislocations escaping at the sample surface. These glide steps imply that the activation of discrete dislocation sources are responsible for the plastic deformation of metallic structures. © 2017 Wiley-VCH Verlag GmbH & Co. KGaA.